Direct measurement of curvature and twist using two-channel double-aperture digital shearography

被引：6

作者：

Bhaduri, Basanta ^{[1
]}

Tay, Cho Jui ^{[1
]}

Quan, Chenggen ^{[1
]}

机构：

[1] Natl Univ Singapore, Dept Mech Engn, Singapore 117576, Singapore

来源：

OPTICAL ENGINEERING | 2010年 / 49卷 / 03期

关键词：

speckle; digital shearography; curvature; twist; filtering; fast Fourier transform; FAST FOURIER-TRANSFORM; OF-PLANE DISPLACEMENT; PATTERN INTERFEROMETRY; DEFORMED OBJECT; SHEARING; SPECKLE; SLOPE; DSPI;

D O I：

10.1117/1.3359470

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A direct method of determining second-order derivatives of displacement (curvature and twist) using two-channel double-aperture digital shearography is presented. Spatial carrier fringes are incorporated inside the speckle using a double-aperture mask in a two-channel experimental setup. Two sets of slope phase maps are generated that are either shifted in the x direction for curvature measurement or in the y direction for twist measurement. Experimental results are presented to verify the validity of the proposed method. (C) 2010 Society of Photo-Optical Instrumentation Engineers. [DOI: 10.1117/1.3359470]

引用

页数：6

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