Electrodynamics-molecular dynamics simulations of the stability of Cu nanotips under high electric field

被引:17
|
作者
Veske, Mihkel [1 ,2 ,3 ]
Parviainen, Stefan [1 ,2 ]
Zadin, Vahur [1 ,2 ,3 ]
Aabloo, Alvo [3 ]
Djurabekova, Flyura [1 ,2 ]
机构
[1] Univ Helsinki, Dept Phys, POB 43,Pietari Kalmin Katu 2, FIN-00014 Helsinki, Finland
[2] Univ Helsinki, Helsinki Inst Phys, POB 43,Pietari Kalmin Katu 2, FIN-00014 Helsinki, Finland
[3] Univ Tartu, Inst Technol, Intelligent Mat & Syst Lab, Nooruse 1, EE-50411 Tartu, Estonia
基金
芬兰科学院;
关键词
shape memory effect; pseudoelasticity; electrodynamics; molecular dynamics; high electric field; field emission current; Cu nanotips; SURFACE;
D O I
10.1088/0022-3727/49/21/215301
中图分类号
O59 [应用物理学];
学科分类号
摘要
The shape memory effect and pseudoelasticity in Cu nanowires represent a possible pair of mechanisms that prevents high aspect ratio nanosized field electron emitters from being stable at room temperature and permits their growth under high electric field. By utilizing hybrid electrodynamics-molecular dynamics simulations, we show that a global electric field of 1 GV m(-1) or more significantly increases the stability and critical temperature of spontaneous reorientation of nanosized < 100 > Cu field emitters. We also show that in the studied tips the stabilizing effect of an external applied electric field is an order of magnitude greater than the destabilization caused by the field emission current. We detect the critical temperature of spontaneous reorientation using a tool that spots changes in crystal structure. The method is compatible with techniques that consider the change in potential energy, has a wider range of applicability and allows different stages in the reorientation processes to be pinpointed.
引用
收藏
页数:9
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