Improved high-temperature characteristics in a thickness-tapered 1.3-μm beam-expander integrated ridge-waveguide laser

被引：2

作者：

Sato, H ^{[1
]}

Aoki, M ^{[1
]}

Tsuchiya, T ^{[1
]}

Komori, M ^{[1
]}

Taike, A ^{[1
]}

Takahashi, M ^{[1
]}

Uomi, K ^{[1
]}

Tsuji, S ^{[1
]}

机构：

[1] Hitachi Ltd, Cent Res Lab, Kokubunji, Tokyo 185, Japan

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 1998年 / 10卷 / 04期

关键词：

beam-expander; low coupling loss; proton implantation; ridge-waveguide; shadow-masked-growth; WTR operation;

D O I：

10.1109/68.662568

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

High-temperature performance of a beam-expander (BEX) integrated laser was dramatically improved by reducing the current leakage in both longitudinal and lateral directions. Proton implantation into the BEX region and a reverse-mesa structure were combined to improve the high-temperature characteristics, A threshold current of 23.1 mA at 85 degrees C and a very high-characteristic temperature T-0 (25 degrees C-85 degrees C) of 74 K were achieved, Stable operation for over 3000 h under a 10-mW output power at 70 degrees C were confirmed.

引用

页码：484 / 486

页数：3

共 7 条

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