Imaging the atomic-scale structure of vanadia powder surface using ambient atomic force microscopy

被引:13
|
作者
Mathieu, C
Peralta, S
Da Costa, A
Barbaux, Y
机构
[1] LPCIA, URA CNRS 402, Université d'Artois
关键词
atomic force microscopy; diffuse reflectance infrared Fourier transform spectroscopy; temperature programmed desorption; vanadium oxide; water adsorption;
D O I
10.1016/S0039-6028(97)00805-4
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Constant force images of vanadia powder were recorded in ambient conditions with atomic force microscopy. Atomic-scale observations of the (001) surface powder were obtained. The images reveal differences from the ideal structure which are attributed to the presence of adsorbed molecular water. A diffuse reflectance infrared Fourier transform spectroscopy study confirms this hypothesis and an adsorption model is proposed. (C) 1998 Elsevier Science B.V.
引用
收藏
页码:L201 / L206
页数:6
相关论文
共 50 条
  • [41] FRICTION FORCE MICROSCOPY IN ULTRAHIGH-VACUUM - AN ATOMIC-SCALE STUDY
    LUTHI, R
    MEYER, E
    HAEFKE, H
    HOWALD, L
    GUNTHERODT, HJ
    GYALOG, T
    THOMAS, H
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1995, 209 : 143 - COLL
  • [42] Theoretical analysis of atomic-scale friction in frictional-force microscopy
    Sasaki, Naruo
    Tsukada, Masaru
    Fujisawa, Satoru
    Sugawara, Yasuhiro
    Morita, Seizo
    TRIBOLOGY LETTERS, 1998, 4 (02) : 125 - 128
  • [43] Theoretical analysis of atomic-scale friction in frictional-force microscopy
    Sasaki, N
    Fujisawa, S
    Sugawara, Y
    Morita, S
    Kobayashi, K
    Tsukada, M
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1997, 213 : 59 - COLL
  • [44] Theoretical analysis of atomic-scale friction in frictional-force microscopy
    N. Sasaki
    M. Tsukada
    S. Fujisawa
    Y. Sugawara
    S. Morita
    Tribology Letters, 1998, 4 : 125 - 128
  • [45] In situ generation and atomic scale imaging of slip traces with atomic force microscopy
    Oele, WF
    Kerssemakers, JWJ
    De Hosson, JTM
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (12): : 4492 - 4497
  • [46] ATOMIC SCALE IMAGING OF ALKANETHIOLATE MONOLAYERS AT GOLD SURFACES WITH ATOMIC FORCE MICROSCOPY
    ALVES, CA
    SMITH, EL
    PORTER, MD
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1992, 114 (04) : 1222 - 1227
  • [47] SCANNING TUNNELING MICROSCOPY - AN ATOMIC-SCALE PROBE OF SURFACE GEOMETRY AND ELECTRONIC-STRUCTURE
    HAMERS, RJ
    KOCH, RH
    DEMUTH, JE
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (03) : C136 - C136
  • [48] SCANNING TUNNELING MICROSCOPY - AN ATOMIC-SCALE PROBE OF SURFACE GEOMETRY AND ELECTRONIC-STRUCTURE
    HAMERS, RJ
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1988, 196 : 21 - COLL
  • [49] Casein imaging using atomic force microscopy
    Helstad, K
    FUTURE TECHNOLOGIES FOR FOOD PRODUCTION AND FUTURE FOOD SCIENTISTS, PROCEEDINGS, 2003, (162): : 88 - 88
  • [50] True Atomic-Resolution Surface Imaging and Manipulation under Ambient Conditions via Conductive Atomic Force Microscopy
    Sumaiya, Saima A.
    Liu, Jun
    Baykara, Mehmet Z.
    ACS NANO, 2022, 16 (12) : 20086 - 20093