Imaging the atomic-scale structure of vanadia powder surface using ambient atomic force microscopy

被引:13
|
作者
Mathieu, C
Peralta, S
Da Costa, A
Barbaux, Y
机构
[1] LPCIA, URA CNRS 402, Université d'Artois
关键词
atomic force microscopy; diffuse reflectance infrared Fourier transform spectroscopy; temperature programmed desorption; vanadium oxide; water adsorption;
D O I
10.1016/S0039-6028(97)00805-4
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Constant force images of vanadia powder were recorded in ambient conditions with atomic force microscopy. Atomic-scale observations of the (001) surface powder were obtained. The images reveal differences from the ideal structure which are attributed to the presence of adsorbed molecular water. A diffuse reflectance infrared Fourier transform spectroscopy study confirms this hypothesis and an adsorption model is proposed. (C) 1998 Elsevier Science B.V.
引用
收藏
页码:L201 / L206
页数:6
相关论文
共 50 条
  • [21] Evidence for atomic-scale resolution in atomic-force microscopy of layer silicates
    Wicks, FJ
    Henderson, GS
    Hawthorne, FC
    Kjoller, K
    CANADIAN MINERALOGIST, 1998, 36 : 1607 - 1614
  • [22] Significant improvements in stability and reproducibility of atomic-scale atomic force microscopy in liquid
    Akrami, S. M. R.
    Nakayachi, H.
    Watanabe-Nakayama, T.
    Asakawa, H.
    Fukuma, T.
    NANOTECHNOLOGY, 2014, 25 (45)
  • [23] ATOMIC-SCALE RESOLUTION ON THE MGO(100) SURFACE BY SCANNING FORCE AND FRICTION MICROSCOPY
    PERROT, E
    DAYEZ, M
    HUMBERT, A
    MARTI, O
    CHAPON, C
    HENRY, CR
    EUROPHYSICS LETTERS, 1994, 26 (09): : 659 - 663
  • [24] Direct Imaging of Atomic-Scale Surface Structures of Brookite TiO2 Nanoparticles by Frequency Modulation Atomic Force Microscopy in Liquid
    Asakawa, Hitoshi
    Holmstrom, Eero
    Foster, Adam S.
    Kamimura, Sunao
    Ohno, Teruhisa
    Fukuma, Takeshi
    JOURNAL OF PHYSICAL CHEMISTRY C, 2018, 122 (42): : 24085 - 24093
  • [25] Is atomic-scale dissipation in NC-AFM real? Investigation using virtual atomic force microscopy
    Trevethan, T.
    Kantorovich, L.
    Polesel-Maris, J.
    Gauthier, S.
    NANOTECHNOLOGY, 2007, 18 (08)
  • [26] ATOMIC-SCALE IMAGING OF PILLARED RECTORITE CATALYSTS WITH THE ATOMIC-FORCE MICROSCOPE
    OCCELLI, ML
    GOULD, SAC
    DRAKE, B
    MICROPOROUS MATERIALS, 1994, 2 (03): : 205 - 215
  • [27] Atomic force microscopy study of diamond-like atomic-scale composite films
    Univ of New York, Brooklyn, United States
    Thin Solid Films, 1-2 (173-178):
  • [28] Mechanics of Interaction and Atomic-Scale Wear of Amplitude Modulation Atomic Force Microscopy Probes
    Vahdat, Vahid
    Grierson, David S.
    Turner, Kevin T.
    Carpick, Robert W.
    ACS NANO, 2013, 7 (04) : 3221 - 3235
  • [29] Development of atomic force microscopy for atomic-scale measurements at solid-liuqid interfaces
    Fukuma T.
    Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering, 2019, 85 (03): : 247 - 250
  • [30] Atomic force microscopy study of diamond-like atomic-scale composite films
    Pollak, FH
    Dorfman, B
    THIN SOLID FILMS, 1997, 292 (1-2) : 173 - 178