Phonon dynamics of liquid Si - inelastic X-ray scattering studies

被引：11
作者：
Hosokawa, S [1 ]
Greif, J
Demmel, F
Pilgrim, WC
机构：
[1] Univ Marburg, Inst Phys Kern & Makromol Chem, F-38042 Grenoble, France
[2] Inst Laue Langevin, F-38042 Grenoble, France
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2003年 / 199卷
关键词：
collective dynamics; inelastic X-ray scattering; liquid semimetal;
D O I：
10.1016/S0168-583X(02)01391-5
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The dynamic structure factors S(Q, omega) of liquid Si were measured at 1480 degreesC using high-resolution inelastic X-ray scattering. The obtained spectra clearly demonstrate the existence of excitations of longitudinal propagating modes. The Q-omega relation of the inelastic modes shows a 15% positive deviation of. the, dispersion relation from hydrodynamics, analogous to liquid alkali metals. However, it is in contrast with liquid Ge,which possesses the electrical-, structural- and thermodynamic properties closely similar to those in l-Si. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：161 / 164
页数：4
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