Extended-range grazing-incidence spectrometer for high-resolution extreme ultraviolet measurements on an electron beam ion trap

被引：26

作者：

Beiersdorfer, P. ^{[1
]}

Magee, E. W. ^{[1
]}

Brown, G. V. ^{[1
]}

Hell, N. ^{[1
,2
]}

Traebert, E. ^{[1
]}

Widmann, K. ^{[1
]}

机构：

[1] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

[2] Univ Erlangen Nurnberg, Dr Remeis Sternwarte & ECAP, D-96049 Bamberg, Germany

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2014年 / 85卷 / 11期

基金：

美国国家航空航天局;

关键词：

SOFT-X-RAY; CHARGED IONS; LINES; REGION; SPECTROSCOPY; EMISSION; SPECTRA; FE;

D O I：

10.1063/1.4891875

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A high-resolution grazing-incidence grating spectrometer has been implemented on the Livermore electron beam ion traps for performing very high-resolution measurements in the soft x-ray and extreme ultraviolet region spanning from below 10 angstrom to above 300 angstrom. The instrument operates without an entrance slit and focuses the light emitted by highly charged ions located in the roughly 50 mu m wide electron beam onto a cryogenically cooled back-illuminated charge-coupled device detector. The measured line widths are below 0.025 angstrom above 100 angstrom, and the resolving power appears to be limited by the source size and Doppler broadening of the trapped ions. Comparisons with spectra obtained with existing grating spectrometers show an order of magnitude improvement in spectral resolution. (C) 2014 AIP Publishing LLC.

引用

页数：3

共 28 条

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