Electron-impact ionization of Xe24+

被引：13
作者：
Pindzola, M. S. [1 ]
Ballance, C. P. [1 ]
Ludlow, J. A. [1 ]
Loch, S. D. [1 ]
Griffin, D. C. [2 ]
机构：
[1] Auburn Univ, Dept Phys, Auburn, AL 36849 USA
[2] Rollins Coll, Dept Phys, Winter Pk, FL 32789 USA
来源：
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 2010年 / 43卷 / 02期
关键词：
R-MATRIX; CROSS-SECTION; SINGLE IONIZATION; EXCITATION; IONS; SCATTERING; COLLISION; XE+;
D O I：
10.1088/0953-4075/43/2/025201
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Configuration-average distorted-wave calculations are carried out for the electron-impact single ionization of Xe24+. Contributions are included from direct ionization of the 3s, 3p, 3d and 4s subshells and from indirect ionization via 3s -> nl, 3p -> nl and 3d -> nl excitations followed by autoionization. Branching ratios are found for single versus double ionization of the 3s and 3p subshells and for autoionization versus radiative decay of all 3l -> nl excitations. Additional distorted-wave and R-matrix calculations find resonant-capture double-autoionization contributions to be quite small. The total ionization cross section for Xe24+ is found to be dominated by indirect excitation-autoionization contributions, especiallynear the single-ionization threshold. An approximate 15% reduction in the total ionization cross section is found due to the radiative decays included in the branching ratios.
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页数：6
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