Highly anisotropic silicon and polysilicon room-temperature etching using fluorine-based high density plasmas

被引:17
|
作者
Tserepi, A [1 ]
Gogolides, E
Cardinaud, C
Rolland, L
Turban, G
机构
[1] NCSR Demokritos, Inst Microelect, IMEL, Aghia Paraskevi 15310, Greece
[2] Univ Nantes, CNRS, Inst Mat Nantes, F-44322 Nantes, France
关键词
D O I
10.1016/S0167-9317(98)00095-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A highly anisotropic Si and Polysilicon plasma etching process at room temperature has been developed in an inductively coupled plasma (ICP) reactor using SF6/CHF3 gas mixtures. The etching rates achieved are much higher than those obtained in a reactive ion etching reactor (RIE), using a similar F-based room temperature process. Etched structures are analysed by SEM and surface chemical analysis (ESCA), while the plasma gas phase is analysed by Optical Emission Spectroscopy (OES).
引用
收藏
页码:411 / 414
页数:4
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