High quality single shot diffraction patterns using ultrashort megaelectron volt electron beams from a radio frequency photoinjector

被引：71

作者：

Musumeci, P. ^{[1
]}

Moody, J. T. ^{[1
]}

Scoby, C. M. ^{[1
]}

Gutierrez, M. S. ^{[1
]}

Bender, H. A. ^{[2
]}

Wilcox, N. S. ^{[2
]}

机构：

[1] Univ Calif Los Angeles, Dept Phys & Astron, Los Angeles, CA 90095 USA

[2] Natl Secur Technol LLC, Los Alamos Operat, Los Alamos, NM 87544 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 01期

关键词：

dark conductivity; diffraction; electron beams; electron diffraction crystallography; gold; phase transformations; X-ray crystallography;

D O I：

10.1063/1.3292683

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Single shot diffraction patterns using a 250-fs-long electron beam have been obtained at the UCLA Pegasus laboratory. High quality images with spatial resolution sufficient to distinguish closely spaced peaks in the Debye-Scherrer ring pattern have been recorded by scattering the 1.6 pC 3.5 MeV electron beam generated in the rf photoinjector off a 100-nm-thick Au foil. Dark current and high emittance particles are removed from the beam before sending it onto the diffraction target using a 1 mm diameter collimating hole. These results open the door to the study of irreversible phase transformations by single shot MeV electron diffraction.

引用

页数：3

共 18 条

[1] Femtosecond electron diffraction for direct measurement of ultrafast atomic motions [J].

Cao, J ;

Hao, Z ;

Park, H ;

Tao, C ;

Kau, D ;

Blaszczyk, L .

APPLIED PHYSICS LETTERS, 2003, 83 (05) :1044-1046

[2] Femtosecond electron diffraction: 'making the molecular movie' [J].

Dwyer, JR ;

Hebeisen, CT ;

Ernstorfer, R ;

Harb, M ;

Deyirmenjian, VB ;

Jordan, RE ;

Miller, RJD .

PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2006, 364 (1840) :741-778

[3]

Grivet P., 1965, ELECT OPTICS

[4] Ultrafast time-resolved electron diffraction with megavolt electron beams [J].

Hastings, J. B. ;

Rudakov, F. M. ;

Dowell, D. H. ;

Schmerge, J. F. ;

Cardoza, J. D. ;

Castro, J. M. ;

Gierman, S. M. ;

Loos, H. ;

Weber, P. M. .

APPLIED PHYSICS LETTERS, 2006, 89 (18)

[5] Ultrafast electron microscopy in materials science, biology, and chemistry [J].

King, WE ;

Campbell, GH ;

Frank, A ;

Reed, B ;

Schmerge, JF ;

Siwick, BJ ;

Stuart, BC ;

Weber, PM .

JOURNAL OF APPLIED PHYSICS, 2005, 97 (11)

[6] Experimental demonstration of high quality MeV ultrafast electron diffraction [J].

Li, Renkai ;

Tang, Chuanxiang ;

Du, Yingchao ;

Huang, Wenhui ;

Du, Qiang ;

Shi, Jiaru ;

Yan, Lixin ;

Wang, Xijie .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2009, 80 (08)

[7] How to realize uniform three-dimensional ellipsoidal electron bunches [J].

Luiten, OJ ;

van der Geer, SB ;

de Loos, MJ ;

Kiewiet, FB ;

van der Wiel, MJ .

PHYSICAL REVIEW LETTERS, 2004, 93 (09) :094802-1

[8] Longitudinal phase space characterization of the blow-out regime of rf photoinjector operation [J].

Moody, J. T. ;

Musumeci, P. ;

Gutierrez, M. S. ;

Rosenzweig, J. B. ;

Scoby, C. M. .

PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS, 2009, 12 (07)

[9] Experimental generation and characterization of uniformly filled ellipsoidal electron-beam distributions [J].

Musumeci, P. ;

Moody, J. T. ;

England, R. J. ;

Rosenzweig, J. B. ;

Tran, T. .

PHYSICAL REVIEW LETTERS, 2008, 100 (24)

[10] Relativistic electron diffraction at the UCLA Pegasus photoinjector laboratory [J].

Musumeci, P. ;

Moody, J. T. ;

Scoby, C. M. .

ULTRAMICROSCOPY, 2008, 108 (11) :1450-1453

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