Procedure for evaluating the crystallinity from X-ray diffraction scans of High and Low Density Polyethylene/SiO2 Composites

被引:0
作者
Sami, A. [1 ]
David, E. [1 ]
Frechette, M. [2 ]
机构
[1] Ecole Technol Super ETS, Varennes, PQ, Canada
[2] Inst Rech Hydro Quebec IREQ, Varennes, PQ, Canada
来源
2010 ANNUAL REPORT CONFERENCE ON ELECTRICAL INSULATION AND DIELECTIC PHENOMENA | 2010年
基金
加拿大自然科学与工程研究理事会;
关键词
HDPE; /; LDPE; SiO2; nanocomposites materials; crystallinity; X-ray diffraction; POLYMERS;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The separation of amorphous and crystalline contributions in diffraction data is a necessary step in the study of the structure of the less-ordered regions and in the calculation of the crystallinity of a HDPE and LDPE/SiO2 nanocomposites. The nanocomposites have been prepared by melt compounding using a twin screw extruder. We suggest here that the diffraction pattern of a nanocomposite with a high degree of crystalline order may be fitted with easily resolvable crystalline peaks, and that the intensity not attributable to the crystalline peaks may be regarded as the amorphous scattering. This amorphous halo can be used as a template in analysing the diffraction patterns of crystalline samples.
引用
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页数:4
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