X-ray determination of Debye-Waller factors of NaBr and NaI

被引：9

作者：

Krishna, PG ^{[1
]}

Subhadra, KG ^{[1
]}

Sirdeshmukh, DB ^{[1
]}

机构：

[1] Kakatiya Univ, Dept Phys, Warangal 506009, Andhra Pradesh, India

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1998年 / 54卷

关键词：

D O I：

10.1107/S0108767397017388

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The Debye-Waller factors of NaBr and NaI have been determined from X-ray diffraction intensities measured at room temperature with a powder X-ray diffractometer. The resulting values are: B+ = 1.55 (15) and B- = 1.14 (10) Angstrom(2) for NaBr and B+ = 2.63 (20) and B- = 1.81 (15) Angstrom(2) for NaI.

引用

页码：253 / 253

页数：1

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