An electrochemical study of photoetching of heteroepitaxial GaN: kinetics and morphology

被引:34
作者
Macht, L
Kelly, JJ
Weyher, JL
Grzegorczyk, A
Larsen, PK
机构
[1] Catholic Univ Nijmegen, RIM, NL-6525 ED Nijmegen, Netherlands
[2] Univ Utrecht, Debye Inst, NL-3584 CH Utrecht, Netherlands
[3] Polish Acad Sci, High Pressure Res Ctr, PL-01142 Warsaw, Poland
关键词
etching; line defects; nitrides;
D O I
10.1016/j.jcrysgro.2004.09.029
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Potentiostatic experiments in KOH solution were used to investigate the photoetching of the Ga-polar face of heteroepitaxial GaN layers grown on sapphire. Different etching regimes are identified; these depend on the applied potential, KOH concentration, light intensity and electron concentration. In particular, the importance of the relative rates of transport of photogenerated holes and OH- ions to the surface for the etching kinetics and morphology is demonstrated. Consequently, the hydrodynamics of the etching system are important. These results form the basis for a comparison with a more widely used approach: photoenhanced open-circuit etching with a counter electrode. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:347 / 356
页数:10
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