Detectors for X-ray diffraction and scattering:: a user's overview

被引：12

作者：

Brügemann, L ^{[1
]}

Gerndt, EKE ^{[1
]}

机构：

[1] Bruker AXS, D-76187 Karlsruhe, Germany

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2004年 / 531卷 / 1-2期

关键词：

X-ray; detector; X-ray diffraction; X-ray scattering; material research; technology transfer;

D O I：

10.1016/j.nima.2004.06.019

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An overview of the applications of X-ray detectors to material research is given. Four experimental techniques and their specific detector requirements are described. Detector types are classified and critical parameters described in the framework of X-ray diffraction and X-ray scattering experiments. The article aims at building a bridge between detector end-users and detector developers. It gives limits of critical detector parameters, like angular resolution, energy resolution, dynamic range, and active area. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：292 / 301

页数：10