Identification of Auger effect as the dominant mechanism for efficiency droop of LEDs

We discuss the unambiguous detection of Auger electrons by electron emission (EE) spectroscopy from a cesiated InGaN/GaN light-emitting diode (LED) under electrical injection. Electron emission spectra were measured as a function of the current injected in the device. The appearance of high-energy electron peaks simultaneously with the droop in LED efficiency shows that hot carriers are being generated in the active region (InGaN quantum wells) by an Auger process. A linear correlation was measured between the high energy emitted electron current and the "droop current" the missing component of the injected current for light emission. We conclude that the droop originates from the onset of Auger processes. We compare such a direct identification of the droop mechanism with other identifications, most of them indirect and based on the many-parameter modeling of the dependence of the external quantum efficiency on the carrier injection.