共 4 条
- [1] Efficient march tests for a reduced 3-coupling and 4-coupling faults in random-access memories JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2004, 20 (03): : 227 - 243
- [2] Efficient March Tests for a Reduced 3-Coupling and 4-Coupling Faults in Random-Access Memories Journal of Electronic Testing, 2004, 20 : 227 - 243
- [3] A New Test Algorithm and Fault Simulator of Simplified Three-Cell Coupling Faults for Random Access Memories IEEE ACCESS, 2024, 12 : 109218 - 109229