Vibrational modes and electronic properties of nitrogen defects in silicon -: art. no. 045206

被引:89
作者
Goss, JP [1 ]
Hahn, I
Jones, R
Briddon, PR
Öberg, S
机构
[1] Univ Exeter, Sch Phys, Exeter EX4 4QL, Devon, England
[2] Univ Newcastle Upon Tyne, Dept Phys, Newcastle Upon Tyne NE1 7RU, Tyne & Wear, England
[3] Lulea Univ Technol, Dept Math, S-97187 Lulea, Sweden
来源
PHYSICAL REVIEW B | 2003年 / 67卷 / 04期
关键词
D O I
10.1103/PhysRevB.67.045206
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Nitrogen impurities form complexes with native defects such as vacancies and self-interstitials in silicon which are stable to high temperatures. These complexes can then suppress the formation of large vacancy and self-interstitial clusters. However, there is little known about their properties. We use first-principles density-functional theory to the determine the local vibrational modes, electrical levels and stability of a range of nitrogen-interstitial and vacancy complexes. Tentative assignments of the ABC photoluminescence line and the trigonal SL6 EPR center are made to substitutional-nitrogen pair and the substitutional-nitrogen-vacancy complex.
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页数:11
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