Metrology, Applications and Methods with High Energy CT Systems

被引：2

作者：

Uhlmann, N. ^{[1
]}

Voland, V. ^{[1
]}

Salamon, M. ^{[1
]}

Hebele, S. ^{[1
]}

Boehnel, M. ^{[1
]}

Reims, N. ^{[1
]}

Schmitt, M. ^{[1
]}

Kasperl, S. ^{[1
]}

Hanke, R. ^{[2
]}

机构：

[1] Fraunhofer IIS EZRT, Dev Ctr Xray Technol, Flugplatzstr 75, D-90768 Furth, Germany

[2] Univ Wurzburg, Chair X ray Microscopy, Furth, Germany

来源：

40TH ANNUAL REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION: INCORPORATING THE 10TH INTERNATIONAL CONFERENCE ON BARKHAUSEN NOISE AND MICROMAGNETIC TESTING, VOLS 33A & 33B | 2014年 / 1581卷

关键词：

Computed Tomography; High Energy; Linear Accelerator; Metrology;

D O I：

10.1063/1.4865039

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The increase of Computed Tomography (CT) as an applicable metrology and Non Destructive Testing (NDT) method raises interest on developing the application fields to larger objects, which were rarely used in the past due to their requirements on the imaging system. Especially the classical X-ray generation techniques based on standard equipment restricted the applications of CT to typical material penetration lengths of only a few cm of steel. Even with accelerator technology that offers a suitable way to overcome these restrictions just the 2D radioscopy technique found a widespread application. Beside the production and detection of photons in the MeV range itself, the achievable image quality is limited using standard detectors due to the dominating absorption effect of Compton Scattering at high energies. Especially for CT reconstruction purposes these effects have to be considered on the development path from 2D to 3D imaging. Most High Energy CT applications are therefore based on line detectors shielding scattered radiation to a maximum with an increase in imaging quality but with time consuming large volume scan capabilities. In this contribution we present the High-Energy X-ray Imaging project at the Fraunhofer Development Centre for X-ray Technology with the characterization and the potential of the CT-system according to metrological and other application capabilities.

引用

页码：1778 / 1785

页数：8