X-ray diffraction and Mossbauer study of (Fe1-xNix)4N (0.2≤x≤0.6) films

被引：9
作者：
El Khiraoui, S.
Sajieddine, M.
Vergnat, A.
Sahlaoui, M.
Bauer, Ph.
Mabrouki, A.
机构：
[1] Univ Cadi Ayyad, Lab Phys & Mecan Mat, FST Beni Mellal, Beni Mellal, Morocco
[2] Nancy Univ, UMR CNRS 7556, Lab Phys Mat, Vandoeuvre Les Nancy, France
[3] Nancy Univ, Lab Sci & Genie Surfaces, F-54042 Nancy, France
来源：
JOURNAL OF ALLOYS AND COMPOUNDS | 2007年 / 440卷 / 1-2期
关键词：
nitride materials; reactive evaporation; Mossbauer spectrometry; X-ray diffraction;
D O I：
10.1016/j.jallcom.2006.10.015
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Single phase (Fe1-xNix)(4)N compounds (0.2 <= x <= 0.6) have been synthesized by reactive evaporation and investigated by X-ray diffraction and Mossbauer spectrometry. The lattice parameters of the nitrides decrease from 3.796 to 3.774 angstrom with increasing Ni concentration. The fitting results of Mossbauer spectra indicate that the average hyperfine field have the same changing tendency with lattice parameter and the nickel atoms have a tendency to be located at the corner site. (c) 2006 Elsevier B.V. All rights reserved.
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页码：43 / 45
页数：3
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