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- [2] Characterisation of TiN and TiAlN thin films deposited on ground surfaces using focused ion beam milling Journal of Materials Science, 2004, 39 : 3569 - 3575
- [3] Transmission electron microscopy of TiN and TiAlN thin films using specimens prepared by focused ion beam milling SURFACE & COATINGS TECHNOLOGY, 2004, 183 (2-3): : 239 - 246
- [4] In-situ characterization of thin films by the focused ion beam JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2000, 18 (04): : 1701 - 1703
- [6] Applicability of focused Ion beam (FIB) milling with gallium, neon, and xenon to the fracture toughness characterization of gold thin films Journal of Materials Research, 2021, 36 : 2505 - 2514
- [9] Synthesis and characterization of TiN/SiNx multilayered thin films by ion beam sputtering 2000, Nihon Shinku Kyokai, Tokyo, Japan (43):
- [10] Synthesis and characterization of TiN/SiNx multilayered thin films by ion beam sputtering 2000, Vacuum Society of Japan, Tokyo, Jpn (43):