A beam hardening correction for X-ray microtomography

被引:15
作者
de Paiva, RF [1 ]
Lynch, J [1 ]
Rosenberg, E [1 ]
Bisiaux, M [1 ]
机构
[1] Inst Francais Petr, F-92500 Rueil Malmaison, France
关键词
X-rays; microtomography; quantification;
D O I
10.1016/S0963-8695(97)00032-7
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We propose a correction of the transmitted intensities in X-ray microscopy allowing improved quantification for polychromatic sources, particularly in tomographic reconstruction. The correction is based on the application of Beer's law for each energy present in the source spectrum. Knowledge of the source spectrum and the average specimen composition are used. The correction is demonstrated on a chemically homogeneous specimen (a glass capillary filled with glass beads) and on a polyphasic oil reservoir rock sample. In the former, detection of 20 mu m defects is demonstrated. In the latter, different minerals, quartz, feldspath and kaolinite, can be discriminated and their distributions mapped. (C) 1997 Elsevier Science Ltd.
引用
收藏
页码:17 / 22
页数:6
相关论文
共 50 条
  • [21] Scintillator to CCD coupling in X-ray microtomography
    Davis, Graham R.
    Elliott, James C.
    DEVELOPMENTS IN X-RAY TOMOGRAPHY V, 2006, 6318
  • [22] X-ray microtomography of plastics and composite materials
    Sasov, A
    DEVELOPMENTS IN X-RAY TOMOGRAPHY III, 2002, 4503 : 274 - 281
  • [23] Desk-top x-ray microtomography
    Sasov, A
    Ceulemans, T
    Van Dyck, D
    METROLOGY-BASED CONTROL FOR MICRO-MANUFACTURING, 2001, 4275 : 147 - 154
  • [24] The effects of x-ray beam hardening on detective quantum efficiency and radiation dose
    Wong, Molly Donovan
    Wu, Xizeng
    Liu, Hong
    JOURNAL OF X-RAY SCIENCE AND TECHNOLOGY, 2011, 19 (04) : 509 - 519
  • [25] Recent advances in X-ray microtomography applied to materials
    Stock, S. R.
    INTERNATIONAL MATERIALS REVIEWS, 2008, 53 (03) : 129 - 181
  • [26] Cork structural discontinuities studied with X-ray microtomography
    Oliveira, Vanda
    Van den Bulcke, Jan
    Van Acker, Joris
    de Schryver, Thomas
    Pereira, Helena
    HOLZFORSCHUNG, 2016, 70 (01) : 87 - 94
  • [27] CHARACTERIZATION OF CARBON CATHODE MATERIALS BY X-RAY MICROTOMOGRAPHY
    Brassard, Martin
    Lebeuf, Martin
    Blais, Alexandre
    Rivoaland, Loig
    Desilets, Martin
    Soucy, Gervais
    LIGHT METALS 2012, 2012, : 1325 - 1329
  • [28] Segementation of X-ray microtomography data of porous scaffold
    Zou, Shuo
    Best, Serena
    Bonfield, William
    BIOCERAMICS, VOL 19, PTS 1 AND 2, 2007, 330-332 : 911 - +
  • [29] X-ray Microtomography to Quantify Morphological Sandstones Properties
    Pires, Luiz Fernando
    de Melo, Mario Sergio
    Ribaski Borges, Jaqueline Aparecida
    Heck, Richard John
    Facin, Paulo Cesar
    BRAZILIAN ARCHIVES OF BIOLOGY AND TECHNOLOGY, 2019, 62 : 1 - 13
  • [30] X-ray microtomography measurements of paper surface roughness
    Li, Jingmei
    Green, Sheldon I.
    NORDIC PULP & PAPER RESEARCH JOURNAL, 2012, 27 (05) : 952 - 957