Smoothing and coherent structure formation in organic-organic heterostructure growth

被引：25
作者：
Hinderhofer, A. [1 ]
Gerlach, A. [1 ]
Kowarik, S. [1 ,2 ]
Zontone, F. [3 ]
Krug, J. [4 ]
Schreiber, F. [1 ]
机构：
[1] Univ Tubingen, Inst Angew Phys, D-72076 Tubingen, Germany
[2] Univ Calif Berkeley, Dept Chem, Berkeley, CA 94720 USA
[3] European Synchrotron Radiat Facil, F-38043 Grenoble 9, France
[4] Univ Cologne, Inst Theoret Phys, D-50937 Cologne, Germany
来源：
EPL | 2010年 / 91卷 / 05期
关键词：
THIN-FILMS; ROUGHNESS; DYNAMICS; ORDER;
D O I：
10.1209/0295-5075/91/56002
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We use in situ real-time X-ray reflectivity and complementary atomic force microscopy to monitor crystallinity and roughness evolution during growth of organic heterostructures, i.e. perfluoropentacene (PFP) on diindenoperylene (DIP) and pentacene (PEN) on PFP. For both systems, surface smoothing during thermal evaporation of the second material on top of the first is observed. The smoothing can be rationalized by a, compared to homoepitaxy, lowered step edge barrier for one species diffusing on the other. In addition, we find an exceptionally well-ordered interface for PEN-on-PFP growth and PEN growth with anomalously low roughening, along with coherent scattering over the entire thickness. Copyright (C) EPLA, 2010
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页数：5
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