Aluminium incorporation for growth optimization of 1.3 μm emission InAs/GaAs quantum dots by molecular beam epitaxy

被引:6
|
作者
Wei, YQ [1 ]
Wang, SM
Ferdos, F
Vukusic, J
Zhao, QX
Sadeghi, M
Larsson, A
机构
[1] Chalmers Univ Technol, Dept Microelect, Photon Lab, SE-41296 Gothenburg, Sweden
[2] Chalmers Univ Technol, Dept Microelect & Nanosci, SE-41296 Gothenburg, Sweden
[3] Chalmers Univ Technol, Microtechnol Ctr Chalmers, SE-41296 Gothenburg, Sweden
关键词
atomic force microscopy; low dimensional structures; nanostructures; molecular beam epitaxy; semiconducting III-V materials; laser diodes;
D O I
10.1016/S0022-0248(02)02408-9
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We have systematically studied the effects of incorporation of Al in the embedding layers of self-organized InAs quantum dots (QDs) grown on GaAs(0 0 1) by molecular-beam epitaxy on their density and structural and optical properties. When using an In0.1AlxGa0.9-xAs lower embedding layer (x = 0.001-0.1) we observe a large increase in QD density with increasing x. The increase is much larger than when increasing the In content in a conventional InxGa1-xAs (x = 0-0.2) lower embedding layer. We attribute the differences to different nucleation mechanisms. Furthermore, introducing a thin InAlAs upper embedding layer results in strong 1.3 mum emission with a large energy separation between the ground and the first excited state transitions. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:172 / 176
页数:5
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