Electromechanical considerations in developing low-voltage RF MEMS switches

被引:225
作者
Peroulis, D [1 ]
Pacheco, SP [1 ]
Sarabandi, K [1 ]
Katehi, LPB [1 ]
机构
[1] Univ Michigan, Dept Elect Engn & Comp Sci, Radiat Lab, Ann Arbor, MI 48109 USA
关键词
low actuation voltage; microelectromechanical systems (MEMS) switches; residual stress; spring constant; switching speed; top-electrode switches;
D O I
10.1109/TMTT.2002.806514
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper reports on the design, fabrication, and testing of a low-actuation voltage Microelectromechanical systems (MEMS) switch for high-frequency applications. The mechanical design of low spring-constant folded-suspension beams is presented first, and switches using these beams are demonstrated with measured actuation voltages of as low as 6 V. Furthermore, common nonidealities such as residual in-plane and gradient stress, as well as down-state stiction problems are addressed, and possible solutions are discussed. Finally, both experimental and theoretical data for the dynamic behavior of these devices are presented. The results of this paper clearly underline the need of an integrated design approach for the development of ultra low-voltage RF MEMS switches.
引用
收藏
页码:259 / 270
页数:12
相关论文
共 37 条
[1]   Optimization of distributed MEMS transmission-line phase shifters - U-band and W-band designs [J].
Barker, N.Scott ;
Rebeiz, Gabriel M. .
IEEE Transactions on Microwave Theory and Techniques, 2000, 48 (11 I) :1957-1966
[2]   ON ISOTHERMAL SQUEEZE FILMS [J].
BLECH, JJ .
JOURNAL OF LUBRICATION TECHNOLOGY-TRANSACTIONS OF THE ASME, 1983, 105 (04) :615-620
[3]  
*CADRE AN, 1999, FINITE ELEMENT STRUC
[4]  
Chang EK, 1997, IEEE MTT-S, P1511, DOI 10.1109/MWSYM.1997.596617
[5]  
Chiao JC, 1999, IEEE MTT-S, P1515, DOI 10.1109/MWSYM.1999.780242
[6]   MEMS microswitches for reconfigurable microwave circuitry [J].
Duffy, S ;
Bozler, C ;
Rabe, S ;
Knecht, J ;
Travis, L ;
Wyatt, P ;
Keast, C ;
Gouker, M .
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 2001, 11 (03) :106-108
[7]   Determining mean and gradient residual stresses in thin films using micromachined cantilevers [J].
Fang, W ;
Wickert, JA .
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 1996, 6 (03) :301-309
[8]  
Fedder GK., 1994, Simulation of microelectromechanical systems
[9]  
Goldsmith C, 2001, IEEE MTT-S, P227, DOI 10.1109/MWSYM.2001.966876
[10]   Performance of low-loss RF MEMS capacitive switches [J].
Goldsmith, CL ;
Yao, ZM ;
Eshelman, S ;
Denniston, D .
IEEE MICROWAVE AND GUIDED WAVE LETTERS, 1998, 8 (08) :269-271