IDDQ test method based on wavelet transformation for noisy current measurement environment

被引：5

作者：

Hashizume, M ^{[1
]}

Yoneda, D ^{[1
]}

Yotsuyanagi, H ^{[1
]}

Tada, T ^{[1
]}

Koyama, T ^{[1
]}

Morita, I ^{[1
]}

Tamesada, T ^{[1
]}

机构：

[1] Univ Tokushima, Tokushima 7708506, Japan

来源：

13TH ASIAN TEST SYMPOSIUM, PROCEEDINGS | 2004年

关键词：

D O I：

10.1109/ATS.2004.50

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

An I-DDQ test method is proposed in this paper, which is applicable even if supply current measurement is impaired by noise. Wavelet transformation is used for noise elimination in the test method. In this paper, it is shown by some experiments that bridging faults will be detected by using the proposed test method. Since expert knowledge on filter design is not needed in noise elimination of the I-DDQ test method, it is expected that the test method will be used in many I-DDQ tests.

引用

页码：112 / 117

页数：6

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