Limiting characteristics of diode temperature sensors

被引:27
作者
Shwarts, YM [1 ]
Borblik, VL [1 ]
Kulish, NR [1 ]
Venger, EF [1 ]
Sokolov, VN [1 ]
机构
[1] Natl Acad Sci Ukraine, Inst Semicond Phys, UA-252650 Kiev, Ukraine
关键词
junction diode; sensor; temperature response curve; sensitivity;
D O I
10.1016/S0924-4247(00)00445-3
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The criteria are formulated, which allow determination of the sets of electrophysical and design parameters of the diode temperature sensors (DTSs) providing either maximal extent of the temperature response curve (TRC) or the maximal sensitivity of DTSs. New method for a self-consistent device optimization is developed in the framework of model of the diffusion current flow through an abrupt asymmetric p-n junction, the ideality factor of which is assumed to be equal to unity. For Si-, GaAs-, and Ge-based DTSs with n(+)-p and p(+)-n junctions, the limiting TRCs and temperature dependencies of the sensitivity have been calculated. The experimentally measured metrology characteristics of DTSs have been shown to be within the range restricted by the established limiting characteristics. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:197 / 205
页数:9
相关论文
共 13 条
[1]  
Bruckner V., 1984, Experimentelle Technik der Physik, V32, P139
[2]  
Buckingham M. J., 1983, Noise in Electronic Devices and Systems (Electrical and Electronic Engineering Series)
[3]   RESIDUAL NON-IDEALITIES IN THE ALMOST IDEAL SILICON P-N-JUNCTION [J].
CEROFOLINI, GF ;
POLIGNANO, ML .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1990, 50 (03) :273-286
[4]   GALLIUM-ARSENIDE PHOSPHIDE LIGHT-EMITTING-DIODES AS GENERAL THERMOMETERS ABOVE 35.K [J].
CHEEKE, JDN ;
NERON, C ;
BRUNELLE, A .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1983, 54 (07) :900-902
[5]   EFFECT OF CURRENT ON THE LOW-TEMPERATURE CHARACTERISTICS OF DIODE SENSORS [J].
CHOPRA, V ;
DHARMADURAI, G .
CRYOGENICS, 1980, 20 (11) :659-662
[6]   PICOSECOND PHOTOCONDUCTIVITY IN GERMANIUM FILMS [J].
DEFONZO, AP .
APPLIED PHYSICS LETTERS, 1981, 39 (06) :480-482
[7]   OBSERVED CIRCUIT LIMITS TO TIME RESOLUTION IN CORRELATION-MEASUREMENTS WITH SI-ON-SAPPHIRE, GAAS, AND INP PICOSECOND PHOTOCONDUCTORS [J].
HAMMOND, RB ;
PAULTER, NG ;
WAGNER, RS .
APPLIED PHYSICS LETTERS, 1984, 45 (03) :289-291
[8]  
*LAK SHOR CRYOTR, 1995, TEMP MEAS CONTR 1
[9]  
LOGVINENKO SP, 1972, KRIOGENNAJA VAKUUMNA, V2, P69
[10]   DIODE THERMOMETERS [J].
SCLAR, N ;
POLLOCK, DB .
SOLID-STATE ELECTRONICS, 1972, 15 (05) :473-+