Spin-coated PMMA films

被引:69
作者
Semaltianos, N. G. [1 ]
机构
[1] Univ Plymouth, Sch Comp Commun & Elect, Plymouth PL4 8AA, Devon, England
关键词
spin coating; PMMA; atomic force microscopy;
D O I
10.1016/j.mejo.2007.04.019
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Polymethylinethacrylate (PMMA) spin-coated thin films are commonly used as resist films in micro/nanofabrication processes. By using atomic force microscopy (AFM) imaging, scratching lithography and force-distance curves spectroscopy, the spin coating and post-processing conditions were determined, for obtaining films whose surface morphology appears featureless or is dominated by pinholes and other surface defects. Featureless appear the surfaces of films spin coated at 8 krpm from a 1.25% solution on silicon substrates and postbaked at 200 degrees C for 2 min on a hot plate, while surface defects in the form of large circular pits with diameters between 10 and 20 mu m and depth of similar to 2 nm dominate the surface morphologies of films spin coated at 7 krpm on glass substrates from a 2% solution and postbaked either at 200 degrees C for 2 min on a hot plate or at 170 degrees C for 30 min in an oven. Surface defects in the form of pinholes appear on the surfaces of films spin coated at 8 krpm on silicon substrates from a 1.25% solution (thickness of similar to 8 nm) and postbaked at 170 degrees C for 60 min in an oven or left in a low vacuum chamber for a few days. The implication of the different film properties-depending on the preparation parameters-in lithographic techniques is explained and discussed in the paper. (C) 2007 Published by Elsevier Ltd.
引用
收藏
页码:754 / 761
页数:8
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