RTL-to-GDS Design Tools for Monolithic 3D ICs

被引:0
作者
Kim, Jinwoo [1 ]
Murali, Gauthaman [1 ]
Vanna-iampikul, Pruek [1 ]
Lee, Edward [1 ]
Kim, Daehyun [1 ]
Chaudhuri, Arjun [2 ]
Banerjee, Sanmitra [2 ]
Chakrabarty, Krishnendu [2 ]
Mukhopadhyay, Saibal [1 ]
Lim, Sung Kyu [1 ]
机构
[1] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
[2] Duke Univ, Dept Elect & Comp Engn, Durham, NC USA
来源
2020 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER AIDED-DESIGN (ICCAD) | 2020年
关键词
Monolithic 3D IC; Physical design (EDA); CNFET; Design-for-test; ILV dual-BIST;
D O I
10.1145/3400302.3415780
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, we propose RTL-to-GDS design flow for monolithic 3D ICs (M3D) built with carbon nanotube field-effect transistors and resistive memory. Our tool flow is based on commercial 2D tools and smart ways to extend them to conduct M3D design and simulation. We provide a post-route optimization flow, which exploits the full potential of the underlying M3D process design kit (PDK) for power, performance and area (PPA) optimization. We also conduct IR-drop and thermal analysis on M3D designs to improve the reliability. To enhance the testability of our M3D designs, we develop designfor-test (DFT) methodologies and integrate a low-overhead built-in self-test module into our design for testing inter-layer vias (ILVs) as well as logic circuitries in the individual tiers. Our benchmark design is RISC-V Rocketcore, which is an open source processor. Our experiments show 8.1% of power, 19.6% of wirelength and 55.7% of area savings with M3D designs at iso-performance compared to its 2D counterpart. In addition, our ER-drop and thermal analyses indicate acceptable power and thermal integrity in our M3D design.
引用
收藏
页数:8
相关论文
共 16 条
[1]  
[Anonymous], 2019, 2019 IEEE EUR TEST S 2019 IEEE EUR TEST S, P1
[2]  
Arabi K., 2015, P INT S PHYS DESIGN, P1
[3]  
Asanovic K., 2016, The Rocket Chip Generator
[4]   3-D Sequential Integration: A Key Enabling Technology for Heterogeneous Co-Integration of New Function With CMOS [J].
Batude, Perrine ;
Ernst, Thomas ;
Arcamone, Julien ;
Arndt, Gregory ;
Coudrain, Perceval ;
Gaillardon, Pierre-Emmanuel .
IEEE JOURNAL ON EMERGING AND SELECTED TOPICS IN CIRCUITS AND SYSTEMS, 2012, 2 (04) :714-722
[5]  
Erb Dominik, 2015, 2015 IEEE 33rd VLSI Test Symposium (VTS). Proceedings, P1, DOI 10.1109/VTS.2015.7116296
[6]  
Fiduccia C.M., 1988, Papers on Twenty-five years of electronic design automation, P175
[7]   Modern microprocessor built from complementary carbon nanotube transistors [J].
Hills, Gage ;
Lau, Christian ;
Wright, Andrew ;
Fuller, Samuel ;
Bishop, Mindy D. ;
Srimani, Tathagata ;
Kanhaiya, Pritpal ;
Ho, Rebecca ;
Amer, Aya ;
Stein, Yosi ;
Murphy, Denis ;
Arvind ;
Chandrakasan, Anantha ;
Shulaker, Max M. .
NATURE, 2019, 572 (7771) :595-+
[8]  
Jutman A, 2004, INT CONF MICROELECTR, P751
[9]   A Design-for-Test Solution Based on Dedicated Test Layers and Test Scheduling for Monolithic 3-D Integrated Circuits [J].
Koneru, Abhishek ;
Kannan, Sukeshwar ;
Chakrabarty, Krishnendu .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2019, 38 (10) :1942-1955
[10]   Compact-2D: A Physical Design Methodology to Build Commercial-Quality Face-to-Face-Bonded 3D ICs [J].
Ku, Bon Woong ;
Chang, Kyungwook ;
Lim, Sung Kyu .
PROCEEDINGS OF THE 2018 INTERNATIONAL SYMPOSIUM ON PHYSICAL DESIGN (ISPD'18), 2018, :90-97