Back-to-back measurement for characterization of phased-array antennas

被引：4

作者：

Chang, WC ^{[1
]}

Wunsch, GJ

Schaubert, DH

机构：

[1] Univ Massachusetts, Dept Elect & Comp Engn, Amherst, MA 01003 USA

[2] Sanders, Nashua, NH 03061 USA

来源：

IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION | 2000年 / 48卷 / 07期

关键词：

measurement; notch array; phased array; tapered slot antenna; waveguide simulator;

D O I：

10.1109/8.876327

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A back-to-back measurement method for characterizing phased-array antennas is described. The method yields the complex active impedance of an antenna in a large phased array at any desired frequency and scan angle without the need of a feed network to excite the antenna under test. This avoids the cost and de-embedding procedure associated with the feed network. Measurements are performed by using two different transmission networks to connect identical arrays in a back-to-back configuration. The new method is particularly well suited to printed antennas and is illustrated by using tapered-slot antennas. Back-to-back measurements in waveguide simulators compare well to traditional waveguide simulator measurements and measurements in an anechoic chamber compare well to results from computer codes based on full-wave method of moments.

引用

页码：1079 / 1085

页数：7

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