A cross-sectional scanning tunneling microscopy study of IrO2 rutile single crystals

被引：12

作者：

Pai, Woei Wu ^{[1
]}

Wu, T. Y.

Lin, C. H.

Wang, B. X.

Huang, Y. S.

Chou, H. L.

机构：

[1] Natl Taiwan Univ, Ctr Condensed Matter Sci, Taipei 106, Taiwan

[2] Natl Taiwan Univ Sci & Technol, Dept Elect Engn, Taipei 106, Taiwan

[3] Natl Taiwan Univ Sci & Technol, Dept Chem Engn, Taipei 106, Taiwan

来源：

SURFACE SCIENCE | 2007年 / 601卷 / 12期

关键词：

cross-sectional STM; XSTM; IrO2; STM; rutile; SURFACE; STM;

D O I：

10.1016/j.susc.2007.04.227

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Rutile iridium dioxide (IrO2) surfaces were studied by cross-sectional scanning tunneling microscopy (XSTM). Atomically flat surfaces prepared by in situ ultra high vacuum cleaving of crystalline platelets of thicknesses < 50 mu m were successfully demonstrated. In addition to (110) surface, several vicinal planes, e.g., (120), (130) and similar to (891), were also examined. The cleaved planes are close to bulk-terminated surfaces with predominant [001]-oriented bridge oxygen rows. Unlike TiO2, bright oxygen rows are imaged and oxygen defects appear as dim species. Our studies show that XSTM is a viable technique to study oxide surfaces that are otherwise difficult to prepare. (c) 2007 Published by Elsevier B.V.

引用

页码：L69 / L72

页数：4

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