Resonance frequency shift in a cavity with a thin conducting film near a conducting wall

被引:9
作者
Braggio, C.
Bressi, G.
Carugno, G.
Dodonov, A. V.
Dodonov, V. V.
Galeazzi, G.
Ruoso, G.
Zanello, D.
机构
[1] Univ Brasilia, Inst Fis, BR-70910900 Brasilia, DF, Brazil
[2] Univ Ferrara, Dipartimento Fis, I-44100 Ferrara, Italy
[3] Ist Nazl Fis Nucl, I-44100 Ferrara, Italy
[4] Ist Nazl Fis Nucl, Sez Pavia, I-27100 Pavia, Italy
[5] Ist Nazl Fis Nucl, Sez Padua, I-35131 Padua, Italy
[6] Univ Fed Sao Carlos, Dept Fis, BR-13565905 Sao Carlos, SP, Brazil
[7] Ist Nazl Fis Nucl, Lab Nazl Legnaro, I-35020 Legnaro, Italy
[8] Ist Nazl Fis Nucl, Sez Rome, I-00185 Rome, Italy
基金
巴西圣保罗研究基金会;
关键词
resonance cavities; frequency shift; damping; quality factor; thin films; skin depth;
D O I
10.1016/j.physleta.2006.11.071
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We show that a very thin conducting film (whose thickness can be much smaller than the skin depth), placed nearby a wall of an electromagnetic cavity, can produce the same shift of the resonance frequency as a bulk conducting slab, provided the displacement of the film from the wall is much bigger than the skin depth. We derive a simple analytical formula for the frequency shift and compare it with exact numerical calculations and experimental data. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:33 / 37
页数:5
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