Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy

被引:157
|
作者
Egerton, R. F. [1 ]
机构
[1] Univ Alberta, Dept Phys, Edmonton, AB T6G 2G7, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
EELS; TEM; radiation effects; Fourier optics; electron scattering;
D O I
10.1016/j.ultramic.2006.11.005
中图分类号
TH742 [显微镜];
学科分类号
摘要
We discuss various factors that determine the performance of electron energy-loss spectroscopy (EELS) and energy-filtered (EFTEM) imaging in a transmission electron microscope. Some of these factors are instrumental and have undergone substantial improvement in recent years, including the development of electron monochromators and aberration correctors. Others, such as radiation damage, delocalization of inelastic scattering and beam broadening in the specimen, derive from basic physics and are likely to remain as limitations. To aid the experimentalist, analytical expressions are given for beam broadening, delocalization length, energy broadening due to core-hole and excited-electron lifetimes, and for the momentum resolution in angle-resolved EELS. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:575 / 586
页数:12
相关论文
共 50 条
  • [1] Atomic resolution electron energy-loss spectroscopy
    Klie, RF
    Arslan, I
    Browning, ND
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2005, 143 (2-3) : 105 - 115
  • [2] Modelling of electron energy-loss spectroscopy detection limits
    Natusch, MKH
    Botton, GA
    Humphreys, CJ
    Krivanek, OL
    ELECTRON MICROSCOPY AND ANALYSIS 1997, 1997, (153): : 339 - 342
  • [3] The ultimate detection limits of electron energy-loss spectroscopy
    Natusch, MKH
    Botton, GA
    Humphreys, CJ
    Krivanek, OL
    ELECTRON, 1998, : 476 - 483
  • [4] Spatial resolution of nanostructural analysis by electron energy-loss spectroscopy and energy-filtered imaging
    Egerton, RF
    JOURNAL OF ELECTRON MICROSCOPY, 1999, 48 (06): : 711 - 716
  • [5] Development of a high energy resolution electron energy-loss spectroscopy microscope
    Terauchi, M
    Tanaka, M
    Tsuno, K
    Ishida, M
    JOURNAL OF MICROSCOPY, 1999, 194 : 203 - 209
  • [6] Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity
    Hart, James L.
    Lang, Andrew C.
    Leff, Asher C.
    Longo, Paolo
    Trevor, Colin
    Twesten, Ray D.
    Taheri, Mitra L.
    SCIENTIFIC REPORTS, 2017, 7
  • [7] Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity
    James L. Hart
    Andrew C. Lang
    Asher C. Leff
    Paolo Longo
    Colin Trevor
    Ray D. Twesten
    Mitra L. Taheri
    Scientific Reports, 7
  • [8] First applications of electron energy-loss spectroscopy with high energy resolution
    Kothleitner, G
    Mitterbauer, C
    Grogger, W
    Zandbergen, H
    Tiemeijer, P
    Freitag, B
    Barfels, M
    Hofer, F
    SPATIALLY RESOLVED CHARACTERIZATION OF LOCAL PHENOMENA IN MATERIALS AND NANOSTRUCTURES, 2003, 738 : 27 - 32
  • [9] Development of a high energy resolution electron energy-loss spectroscopy microscope
    Terauchi, M.
    Tanaka, M.
    Tsuno, K.
    Ishida, M.
    Journal of Microscopy, 1999, 194 (01): : 203 - 209
  • [10] ELECTRON ENERGY-LOSS SPECTROSCOPY
    WILLIAMS, BG
    PROGRESS IN SOLID STATE CHEMISTRY, 1987, 17 (02) : 87 - 143