The application of convolution-based statistical model on the electrical breakdown time delay distributions in neon

The convolution-based model of the electrical breakdown time delay distribution is applied for statistical analysis of experimental results obtained in neon-filled diode tube at 6.5 mbar. At first, the numerical breakdown time delay density distributions are obtained by stochastic modeling as the sum of two independent random variables, the electrical breakdown statistical time delay with exponential, and discharge formative time with Gaussian distribution. Then, the single characteristic breakdown time delay distribution is obtained as the convolution of these two random variables with previously determined parameters. These distributions show good correspondence with the experimental distributions, obtained on the basis of 1000 successive and independent measurements. The shape of distributions is investigated, and corresponding skewness and kurtosis are plotted, in order to follow the transition from Gaussian to exponential distribution. (C) 2004 American Institute of Physics.