A Multi-Dimensional Pattern Run-Length Method for Test Data Compression

被引：2

作者：

Lee, Lung-Jen ^{[1
]}

Tseng, Wang-Dauh ^{[1
]}

Lin, Rung-Bin ^{[1
]}

Lee, Chen-Lun ^{[1
]}

机构：

[1] Yuan Ze Univ, Dept Comp Sci & Engn, Chungli 32003, Taiwan

来源：

2009 ASIAN TEST SYMPOSIUM, PROCEEDINGS | 2009年

关键词：

test data compression; pattern run-length; code-based testing; SOC; ATE; POWER;

D O I：

10.1109/ATS.2009.49

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper presents a run-length-based compression method considering dimensions of pattern information. Information such as pattern length and number of pattern runs is encoded to denote the compression status. The decoder is simple and requires very low hardware overhead. Significant improvements are experimentally demonstrated on larger ISCAS'89 benchmarks.

引用

页码：325 / 330

页数：6