A Multi-Dimensional Pattern Run-Length Method for Test Data Compression

被引：2
|
作者：
Lee, Lung-Jen [1 ]
Tseng, Wang-Dauh [1 ]
Lin, Rung-Bin [1 ]
Lee, Chen-Lun [1 ]
机构：
[1] Yuan Ze Univ, Dept Comp Sci & Engn, Chungli 32003, Taiwan
来源：
2009 ASIAN TEST SYMPOSIUM, PROCEEDINGS | 2009年
关键词：
test data compression; pattern run-length; code-based testing; SOC; ATE; POWER;
D O I：
10.1109/ATS.2009.49
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper presents a run-length-based compression method considering dimensions of pattern information. Information such as pattern length and number of pattern runs is encoded to denote the compression status. The decoder is simple and requires very low hardware overhead. Significant improvements are experimentally demonstrated on larger ISCAS'89 benchmarks.
引用
收藏
页码：325 / 330
页数：6
相关论文
共 50 条
  • [1] Test Data Compression Using Multi-dimensional Pattern Run-length Codes
    Tseng, Wang-Dauh
    Lee, Lung-Jen
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2010, 26 (03): : 393 - 400
  • [2] Test Data Compression Using Multi-dimensional Pattern Run-length Codes
    Wang-Dauh Tseng
    Lung-Jen Lee
    Journal of Electronic Testing, 2010, 26 : 393 - 400
  • [3] A Novel Pattern Run-Length Coding Method for Test Data Compression
    Wu, Diancheng
    Liu, Yu
    Zhu, Hao
    Wang, Donghui
    Hao, Chengpeng
    IEICE TRANSACTIONS ON ELECTRONICS, 2013, E96C (09): : 1201 - 1204
  • [4] 2n Pattern Run-Length for Test Data Compression
    Lee, Lung-Jen
    Tseng, Wang-Dauh
    Lin, Rung-Bin
    Chang, Cheng-Ho
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2012, 31 (04) : 644 - 648
  • [5] Test data compression using a hybrid run-length code method
    Hur, Y
    IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2005, E88D (07): : 1607 - 1609
  • [6] AN ENHANCED RUN-LENGTH ENCODING COMPRESSION METHOD FOR TELEMETRY DATA
    Shan, Yanhu
    Ren, Yongfeng
    Zhen, Guoyong
    Wang, Kaiqun
    METROLOGY AND MEASUREMENT SYSTEMS, 2017, 24 (03) : 551 - 562
  • [7] Test data compression using alternating variable run-length code
    Ye, Bo
    Zhao, Qian
    Zhou, Duo
    Wang, Xiaohua
    Luo, Min
    INTEGRATION-THE VLSI JOURNAL, 2011, 44 (02) : 103 - 110
  • [8] Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length Coding
    Yuan, Haiying
    Mei, Jiaping
    Song, Hongying
    Guo, Kun
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2014, 30 (02): : 237 - 242
  • [9] Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length Coding
    Haiying Yuan
    Jiaping Mei
    Hongying Song
    Kun Guo
    Journal of Electronic Testing, 2014, 30 : 237 - 242
  • [10] A Power Efficient Test Data Compression Method for SoC using Alternating Statistical Run-Length Coding
    Yuan, Haiying
    Guo, Kun
    Sun, Xun
    Ju, Zijian
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2016, 32 (01): : 59 - 68
12345