Porous silicon in solvents: Constant-lifetime PL quenching and confirmation of dielectric effects

被引:0
作者
Fellah, S
Ozanam, F
Gabouze, N
Chazalviel, JN
机构
[1] UDTS, Algiers, Algeria
[2] Ecole Polytech, CNRS, Lab PMC, F-91128 Palaiseau, France
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2000年 / 182卷 / 01期
关键词
D O I
10.1002/1521-396X(200011)182:1<367::AID-PSSA367>3.3.CO;2-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The time-resolved photoluminescence (FL) of luminescent porous silicon has been investigated insitu when porous silicon is immersed in chemically inert organic solvents. PL transients are re corded upon square-wave modulation of the excitation light. They are fairly well fitted with exponential curves. The obtained lifetimes lie in the 1-100 mus range, and decrease with increasing emission energy. At a given energy, the lifetimes exhibit a weak decrease when porous silicon is immersed in a solvent, whilst the PL intensity decreases by more than three orders of magnitude when the dielectric constant of the: solvent increases From 2 to 20. The weak variation of the lifetime indicates that the PI. quenching necessarily involves a decrease of the radiative recombination probability. This is accounted for in a model where the solvent-induced dielectric screening favours geminate pair dissociation.
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页码:367 / 372
页数:6
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