Universal temperature scaling of flux line pinning in high-temperature superconducting thin films

Dissipation-free current transport in high-temperature superconductors is one of the most crucial properties of this class of materials which is directly related to the effective inhibition of flux line movement by defect structures. In this respect epitaxially grown thin films of YBa2Cu3O7-d (YBCO) are proving to be the strongest candidates for many widescale applications that are close to realization. We show that the relation between different defect structures and flux line pinning in these films exhibits universal features which are clearly displayed in a detailed analysis of the temperature-dependent behaviour of local critical currents. This allows us to identify different pinning mechanisms at different temperatures to be responsible for the critical currents found. Additionally, the presence of grain boundaries with very low misorientation angles affects the temperature stability of the critical currents, which has important consequences for future applications.