Characterization of copper selenide thin films deposited by chemical bath deposition technique

被引：0
|
作者：
Al-Mamum [1 ]
Islam, ABMO [1 ]
机构：
[1] Univ Dhaka, Dept Phys, Dhaka 1000, Bangladesh
来源：
APPLIED SURFACE SCIENCE | 2004年 / 238卷 / 1-4期
关键词：
AFM; CBD; copper selenide; XPS; XRD;
D O I：
暂无
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
A low-cost chemical bath deposition (CBD) technique has been used for the preparation of Cu2-xSe thin films onto glass substrates and deposited films were characterized by X-ray diffractometry (XRD), X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM) and UV-vis spectrophotometry. Good quality thin films of smooth surface of copper selenide thin films were deposited using sodium selenosulfate as a source of selenide ions. The structural and optical behaviour of the films are discussed in the light of the observed data. (C) 2004 Elsevier B.V. All rights reserved.
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收藏
页码：184 / 188
页数：5
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