Low-temperature scanning force microscopy using a tuning fork transducer

被引：0

作者：

Seo, Yongho ^{[1
]}

Cadden-Zimansky, Paul

Chandrasekhar, Venkat

机构：

[1] Northwestern Univ, Dept Phys & Astron, Evanston, IL 60208 USA

[2] Sejong Univ, Fac Nanotechnol & Adv Mat Engn, Seoul 143747, South Korea

[3] Sejong Univ, Inst Fundamental Phys, Seoul 143747, South Korea

来源：

JOURNAL OF THE KOREAN PHYSICAL SOCIETY | 2007年 / 50卷 / 02期

关键词：

scanning probe microscopy; atomic force microscopy; tuning fork; low temperature spm;

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We developed a low-temperature scanning force microscope using a quartz tuning fork operating at 4.2 K. A silicon tip from a commercial cantilever was attached to one prong of the tuning fork. With a metallic coating, a potential could be applied to the tip to sense the charge distribution in a sample while with a magnetically coated tip, magnetic force imaging could be performed. For the coarse approach mechanism, we developed a reliable low-temperature walker with low material cost and simple machining. We obtained Coulomb force images of boron nanowires at room temperature and of magnetic nano-structures at low temperature. With the tuning-fork-based magnetic force microscopy (MFM) probe, low-temperature MFM was performed at 77 K and 4.2 K in a high magnetic field (up to 3 T) by using a superconducting.

引用

页码：378 / 383

页数：6

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