Resonance shift effects in apertureless scanning near-field optical microscopy -: art. no. 085409

被引：72

作者：

Porto, JA ^{[1
]}

Johansson, P

Apell, SP

López-Ríos, T

机构：

[1] Chalmers Univ Technol, Dept Appl Phys, S-41296 Gothenburg, Sweden

[2] Univ Gothenburg, S-41296 Gothenburg, Sweden

[3] Univ Orebro, Dept Nat Sci, S-70182 Orebro, Sweden

[4] CNRS, Etud Proprietes Elect Solides Lab, F-38042 Grenoble 9, France

来源：

PHYSICAL REVIEW B | 2003年 / 67卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.67.085409

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We develop a theory to study apertureless scanning near-field optical microscopy which takes into account retardation, higher multipoles of the tip, and the multiple scattering between the tip and the surface. We focus on metallic systems and discuss the implication of the formation of tip-induced surface plasmon modes in the tip-surface system. We discuss the effects associated with the shift in energy of those modes as a function of the tip-surface distance. Both the local field and the scattering cross section are enhanced when the tip approaches the surface, but there is no general correspondence between the two enhancements.

引用

页数：9