Subgrains, micro-twins and dislocations characterization in monolike Si using TEM and in-situ TEM

被引:11
作者
Lantreibecq, A. [1 ,2 ]
Monchoux, J. -Ph. [1 ]
Pihan, E. [2 ]
Marie, B. [2 ]
Legros, M. [1 ]
机构
[1] Univ Toulouse, CNRS, CEMES, 29 Rue J Marvig, F-31055 Toulouse, France
[2] Univ Grenoble Alpes, INES, F-73375 Le Bourget Du Lac, France
关键词
PV Si; dislocations; sub-grain boundaries; micro-twin; growth; defects; Transmission electron microscopy (TEM); in-situ TEM; CRYSTALLINE SILICON; DIRECTIONAL SOLIDIFICATION; MULTICRYSTALLINE SILICON; PLASTIC-DEFORMATION; SOLAR-CELLS; BEHAVIOR; DYNAMICS; FATIGUE; INGOTS; GROWTH;
D O I
10.1016/j.matpr.2018.03.063
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A critical aspect in the development of mono-like Silicon for photovoltaic (PV) application lies in the control of its defect microstructure. While micro-twins do not seem to represent a major concern regarding electrical activity, some dislocations and low angle grain boundaries need to be avoided in the growing process because of their recombination properties. Here, we have studied how these defects grow and interact together in order to understand what are the mechanisms responsible for their presence in the cast ingots. We show that, in our specific convex liquid-solid interface growth mode, micro-twins probably originate from this interface while dislocations and subgrains build up both by epitaxy at the solid liquid interface and through dislocation-boundary interactions in the solidified region. Post-growth TEM characterization allowed identifying constitutive dislocations of some subgrain boundaries for the case of [001] seeds. In-situ TEM straining of Si at high temperature also allowed measuring dislocation mobility at several temperatures. Those are compared to the dislocation velocities in pure Czochralski Si found in literature. (C) 2017 Elsevier Ltd. All rights reserved.
引用
收藏
页码:14732 / 14747
页数:16
相关论文
共 43 条
  • [41] STRUCTURAL CHARACTERIZATION OF LOW-TEMPERATURE EPI-SILICON GROWN ON (100) AND (111) SI SUBSTRATES USING ULTRAHIGH RESOLUTION CROSS-SECTIONAL TEM
    YE, ZZ
    LIU, YP
    ZHOU, ZH
    REIF, R
    JOURNAL OF ELECTRONIC MATERIALS, 1993, 22 (02) : 247 - 253
  • [42] Strain partitioning characterization of advanced high strength steels using in-situ tensile tests with Micro digital image correlation - Methodology and analysis
    Bardelcik, Alexander
    Butler, Quade
    MATERIALS CHARACTERIZATION, 2024, 218
  • [43] Microstructural characterization of in-situ MgAl2O4 nanoparticles reinforced Al-2Mg-1Si composite produced using the ultrasonic assisted stir casting process
    Kumar, T. Satish
    Thankachan, Titus
    Giri, Jayant
    Makki, Emad
    Dhanasekar, R.
    Guru, Ajay
    JOURNAL OF MATERIALS RESEARCH AND TECHNOLOGY-JMR&T, 2024, 29 : 2458 - 2467