Resistive switching in a LaMnO3+δ/TiN memory cell investigated by operando hard X-ray photoelectron spectroscopy

被引：13
|
作者：
Meunier, Benjamin [1 ]
Martinez, Eugenie [2 ]
Rodriguez-Lamas, Raquel [1 ]
Pla, Dolors [1 ]
Burriel, Monica [1 ]
Boudard, Michel [1 ]
Jimenez, Carmen [1 ]
Rueff, Jean-Pascal [3 ,4 ]
Renault, Olivier [2 ]
机构：
[1] Univ Grenoble Alpes, CNRS, Grenoble INP, LMGP, F-38000 Grenoble, France
[2] Univ Grenoble Alpes, CEA, LETI, F-38000 Grenoble, France
[3] Synchrotron SOLEIL, BP 48, F-91192 Gif Sur Yvette, France
[4] Sorbonne Univ, CNRS, LCPMR, F-75005 Paris, France
来源：
JOURNAL OF APPLIED PHYSICS | 2019年 / 126卷 / 22期
关键词：
BURIED INTERFACES; XPS; QUANTIFICATION; RESISTANCE; MANGANITE; SURFACE; HAXPES; OXIDES; BULK;
D O I：
10.1063/1.5125420
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Transition metal oxides are promising candidates in the development of valence change memories thanks to their ability to present the valence change mechanism. The resistive switching mechanism of TiN/LaMnO3 + delta (LMO)/Pt devices was investigated by operando hard X-ray photoelectron spectroscopy after careful in situ electrical characterization. The results presented here highlight the oxygen exchange process at the TiN/LMO interface. The active TiN top electrode acts as an oxygen getter, pumping O2- anions that are attracted by the positive bias and repelling them under negative bias. This drift of charged defects is correlated with variations of the interfacial resistance. Our results confirm the critical role of the TiN/LMO interface and oxygen drift in the resistive switching behavior of such devices. Published under license by AIP Publishing.
引用
收藏
页数：5
相关论文
共 50 条
  • [21] Hard X-ray photoelectron and X-ray absorption spectroscopy characterization of oxidized surfaces of iron sulfides
    Mikhlin, Yuri
    Tomashevich, Yevgeny
    Vorobyev, Sergey
    Saikova, Svetlana
    Romanchenko, Alexander
    Felix, Roberto
    APPLIED SURFACE SCIENCE, 2016, 387 : 796 - 804
  • [22] Direct observation of the energetics at a semiconductor/liquid junction by operando X-ray photoelectron spectroscopy
    Lichterman, Michael F.
    Hu, Shu
    Richter, Matthias H.
    Crumlin, Ethan J.
    Axnanda, Stephanus
    Favaro, Marco
    Drisdell, Walter
    Hussain, Zahid
    Mayer, Thomas
    Brunschwig, Bruce S.
    Lewis, Nathan S.
    Liu, Zhi
    Lewerenz, Hans-Joachim
    ENERGY & ENVIRONMENTAL SCIENCE, 2015, 8 (08) : 2409 - 2416
  • [23] γ-Al2O3 by Ag Lα, hard x-ray photoelectron spectroscopy
    Rodriguez-Pereira, Jhonatan
    Rincon-Ortiz, Sergio A.
    Ospina, Rogelio
    SURFACE SCIENCE SPECTRA, 2022, 29 (02):
  • [24] X-ray Photoelectron Spectroscopy Study of Indium Tin Mixed Oxides on the Surface of Silicate Glass
    Teterin, Yu A.
    Maslakov, K., I
    Murav'ev, E. N.
    Teterin, A. Yu
    Bulychev, N. A.
    Meshkov, B. B.
    Stepnov, D. S.
    INORGANIC MATERIALS, 2020, 56 (05) : 482 - 493
  • [25] The GALAXIES beamline at the SOLEIL synchrotron: inelastic X-ray scattering and photoelectron spectroscopy in the hard X-ray range
    Rueff, J-P.
    Ablett, J. M.
    Ceolin, D.
    Prieur, D.
    Moreno, Th.
    Baledent, V.
    Lassalle-Kaiser, B.
    Rault, J. E.
    Simon, M.
    Shukla, A.
    JOURNAL OF SYNCHROTRON RADIATION, 2015, 22 : 175 - 179
  • [26] X-ray photoelectron spectroscopy studies of indium tin oxide nanocrystalline powder
    Pujilaksono, B
    Klement, U
    Nyborg, L
    Jelvestam, U
    Hill, S
    Burgard, D
    MATERIALS CHARACTERIZATION, 2005, 54 (01) : 1 - 7
  • [27] Characterization of buried interfaces using Ga Kα hard X-ray photoelectron spectroscopy (HAXPES)
    Spencer, B. F.
    Church, S. A.
    Thompson, P.
    Cant, D. J. H.
    Maniyarasu, S.
    Theodosiou, A.
    Jones, A. N.
    Kappers, M. J.
    Binks, D. J.
    Oliver, R. A.
    Higgins, J.
    Thomas, A. G.
    Thomson, T.
    Shard, A. G.
    Flavell, W. R.
    FARADAY DISCUSSIONS, 2022, 236 (00) : 311 - 337
  • [28] Thickness and structure of thin films determined by background analysis in hard X-ray photoelectron spectroscopy
    Cui, Yi-Tao
    Tougaard, Sven
    Oji, Hiroshi
    Son, Jin-Young
    Sakamoto, Yasuhiro
    Matsumoto, Takuya
    Yang, Anli
    Sakata, Osami
    Song, Huaping
    Hirosawa, Ichiro
    JOURNAL OF APPLIED PHYSICS, 2017, 121 (22)
  • [29] Application of hard X-ray photoelectron spectroscopy to electronic structure measurements for various functional materials
    Ueda, S.
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2013, 190 : 235 - 241
  • [30] Lithium intercalation/deintercalation in transition metal oxides investigated by X-ray photoelectron spectroscopy
    Dupin, JC
    Gonbeau, D
    Martin-Litas, I
    Vinatier, P
    Levasseur, A
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2001, 120 (1-3) : 55 - 65
12345