Wavelet energy-based testing using supply current measurements

被引：11

作者：

Dimopoulos, M. G. ^{[1
]}

Spyronasios, A. D. ^{[2
]}

Papakostas, D. K. ^{[1
]}

Hatzopoulos, A. A. ^{[2
]}

机构：

[1] Alexander Technol Educ Inst Thessaloniki, Dept ELEC, Thessaloniki 57400, Greece

[2] Aristotle Univ Thessaloniki, Dept Elect & Comp Engn, Thessaloniki 54124, Greece

来源：

IET SCIENCE MEASUREMENT & TECHNOLOGY | 2010年 / 4卷 / 02期

关键词：

NEURAL-NETWORKS; FAULT-DETECTION; ANALOG; CIRCUITS;

D O I：

10.1049/iet-smt.2009.0037

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this study a test method based on wavelet energy of the supply current measurements is presented. The method has been utilised by a microcontroller-based versatile test system which is used for the production line testing of emergency luminaire products. The presented method is simple, offers a single-point test measurement solution and may easily be adapted to test various other analogue and mixed-signal systems. Fault detectability comparative experimental results between the wavelet energy and the root mean square (RMS) plus spectrum component values of the supply current measurements are presented showing the effectiveness of the proposed test method.

引用

页码：76 / 85

页数：10

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