Effects of Ni addition on the interfacial reactions between Sn-Cu solders and Ni substrate

被引:51
作者
Wang, Chao-hong [1 ]
Shen, Han-ting [1 ]
机构
[1] Natl Chung Cheng Univ, Dept Chem Engn, Chiayi 62102, Taiwan
关键词
Intermetallics; miscellaneous; Bonding; Phase transformations; Joining; RELIABILITY; COUPLES; ALLOYS; JOINTS;
D O I
10.1016/j.intermet.2009.10.018
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
This research investigates the effects of adding a small amount of Ni to solder. The interfacial reactions between Ni and the Sn-Cu solders at 250 C are examined. Two sets of Sn-0.7 wt% Cu-xNi solders and Sn-1.0 wt% Cu-xNi solders (x = 0.02, 0.05 and 0.1 wt%) were prepared. The results reveal that the interfacial reactions are very sensitive to Ni. With increasing Ni addition, the reaction phase grain, Cu6Sn5, becomes larger and its morphology changes from a rod-like shape into a faceted structure. The reaction progressions are accelerated in comparison with those without Ni addition. The solder spreading effect on the Cu6Sn5 morphology was also investigated. Cu6Sn5 exhibits a gradual change in microstructure from the center to the rim for the case when the solder ball spreads over a Ni substrate. However, the solder does not alter the Cu6Sn5 microstructure while reacting on a small Ni pad without spreading. This suggests that the Cu and Ni contents in the solder near the interface vary during the solder ball spreading process. (C) 2009 Published by Elsevier Ltd.
引用
收藏
页码:616 / 622
页数:7
相关论文
共 25 条
  • [11] Effect of Cu content on interfacial reactions between Sn(Cu) alloys and Ni/Ti thin-film metallization
    Hsu, SC
    Wang, SJ
    Liu, CY
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2003, 32 (11) : 1214 - 1221
  • [12] Effects of Cu contents in Pb-free solder alloys on interfacial reactions and bump reliability of Pb-free solder bumps on electroless Ni-P under-bump metallurgy
    Jeon, YD
    Paik, KW
    Ostmann, A
    Reichl, H
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2005, 34 (01) : 80 - 90
  • [13] Chen JW, 2007, J CHINA UNIV GEOSCI, V18, P37
  • [14] Phase equilibria and solidification properties of Sn-Cu-Ni alloys
    Lin, CR
    Chen, SW
    Wang, CH
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2002, 31 (09) : 907 - 915
  • [15] Interfacial reaction between Sn-0.7Cu (-Ni) solder and Cu substrate
    Nishikawa, H
    Piao, JY
    Takemoto, T
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2006, 35 (05) : 1127 - 1132
  • [16] Growth mechanism of bulk Ag3Sn intermetallic compounds in Sn-Ag solder during solidification
    Shen, J.
    Chan, Y. C.
    Liu, S. Y.
    [J]. INTERMETALLICS, 2008, 16 (09) : 1142 - 1148
  • [18] A study on the reaction between cu and Sn3.5Ag solder doped with small amounts of Ni
    Tsai, JY
    Hu, YC
    Tsai, CM
    Kao, CR
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2003, 32 (11) : 1203 - 1208
  • [19] Sn-0.7 wt.%Cu/Ni interfacial reactions at 250°C
    Wang, CH
    Chen, SW
    [J]. ACTA MATERIALIA, 2006, 54 (01) : 247 - 253
  • [20] Interfacial reactions in Sn-(Cu)/Cu6Sn5/Ni couples at 210 °C
    Wang, Chao-Hong
    Chen, Sinn-Wen
    [J]. INTERMETALLICS, 2008, 16 (04) : 531 - 537