Deflection determination of V-beam thermal sensors using Digital Image Correlation

被引：6

作者：

Chiorean, Radu ^{[1
]}

Dudescu, Cristian ^{[1
]}

Pustan, Marius ^{[1
]}

Hardau, Mihail ^{[1
]}

机构：

[1] Tech Univ Cluj Napoca, Cluj Napoca 400641, Romania

来源：

PROCEEDINGS OF THE 14TH SYMPOSIUM ON EXPERIMENTAL STRESS ANALYSIS AND MATERIALS TESTING | 2014年 / 601卷

关键词：

V-beam sensor; thermal load; Digital Image Correlation;

D O I：

10.4028/www.scientific.net/KEM.601.41

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The purpose of this paper is to present some results and benefits for using the 2D Digital Image Correlation (DIC) method on the deflection determination of the V-beam thermal sensor. Therefore, the influence of the main geometrical parameters of the V-beam type thermal sensors on its deflection is evaluated. An experimental set-up was designed in order to acquire high resolution images of the deformed sensor at different temperatures. The analytical and the finite element (FE) studies that were performed on theoretical models of the V-beam sensor led to the validation of the experimental results and thus to the validation of the method.

引用

页码：41 / 44

页数：4

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