Complex dynamic behavior of fluctuating smectic-A films as studied by scattering with coherent X-rays

被引：38
作者：
Fera, A
Dolbnya, IP
Grübel, G
Muller, HG
Ostrovskii, BI
Shalaginov, AN
de Jeu, WH
机构：
[1] FOM, Inst Atom & Mol Phys, NL-1098 SJ Amsterdam, Netherlands
[2] European Synchrotron Radiat Facil, DUBBLE CRG, F-38043 Grenoble, France
[3] Budker Inst Nucl Phys, Novosibirsk 630090, Russia
[4] European Synchrotron Radiat Facil, ID10, F-38043 Grenoble, France
[5] Russian Acad Sci, Inst Crystallog, Moscow 117333, Russia
[6] Univ Guelph, Dept Phys, Guelph, ON N1G 2W1, Canada
[7] Univ Guelph, Guelph Waterloo Phys Inst, Guelph, ON N1G 2W1, Canada
来源：
PHYSICAL REVIEW LETTERS | 2000年 / 85卷 / 11期
关键词：
D O I：
10.1103/PhysRevLett.85.2316
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Coherent dynamic x-ray scattering has been used to study the thermally excited layer fluctuations in freely suspended smectic films of the compound 4O.8. Using 8-keV x rays and films with a thickness around 0.3 mu m we resolve relaxation times down to a few mu s A combination of damped and oscillatory behavior is observed for the layer undulations, which can be attributed to inertial effects. These are due to the surface contribution to the free energy which cannot be disregarded for thin films.
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页码：2316 / 2319
页数：4
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