Tantalum nitride nanowires: Synthesis and characterization

被引：5
|
作者：
Zhou, Yongsheng [1 ,2 ]
Jin, Pan [1 ]
Chen, Shifu [1 ]
Zhu, Yingchun [2 ]
机构：
[1] Anhui Sci & Technol Univ, Coll Chem & Mat Engn, Bengbu 233100, Peoples R China
[2] Chinese Acad Sci, Key Lab Inorgan Coating Mat, Shanghai Inst Ceram, Shanghai 200050, Peoples R China
来源：
MATERIALS LETTERS | 2014年 / 136卷
关键词：
Sintering; Tantalum nitride; Nanowires; Microstructure; NITROGEN; COPPER; FILMS;
D O I：
10.1016/j.matlet.2014.08.051
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
TaN0.43 nanowires have been prepared via a controlled thermal process using spongiform Ta as precursor. Scanning electron microscopy (SEM), X-ray diffraction (XRD) and transmission electron microscopy (TEM) were used to characterize the compositions, morphology, and structures of the samples. The results show that the sample consisted of single-crystalline nanorods with the diameter of 100-500 nm. The X-ray diffraction pattern of the product was indexed as the hexagonal TaN0.43. TEM and selected area electron diffraction (SAED) patterns identify that the TaN0.43 nanowires are single-crystalline in nature. The TaN0.43 nanowires display an intensive violet PL emission at around 432 am. A growth mechanism is proposed for the formation of nanowires. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码：168 / 170
页数：3
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