Collecting 3D electron diffraction data by the rotation method

被引：266
|
作者：
Zhang, Daliang [1 ,2 ]
Oleynikov, Peter [1 ]
Hovmoller, Sven [1 ]
Zou, Xiaodong [1 ]
机构：
[1] Stockholm Univ, Dept Mat & Environm Chem, S-10691 Stockholm, Sweden
[2] Jilin Univ, State Key Lab Inorgan Synth & Preparat Chem, Changchun 130012, Peoples R China
来源：
ZEITSCHRIFT FUR KRISTALLOGRAPHIE-CRYSTALLINE MATERIALS | 2010年 / 225卷 / 2-3期
关键词：
Electron diffraction; Data collection; 3D diffraction data; PRECESSION TECHNIQUE; MICROSCOPY; BEAM; CRYSTALLOGRAPHY; INTENSITIES; SYSTEM; PHASE; MODEL; AREA;
D O I：
10.1524/zkri.2010.1202
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
A new method for collecting complete three-dimensional electron diffraction data is described. Diffraction data is collected by combining electron beam tilt at many very small steps, with rotation of the crystal in a few but large steps. A number of practical considerations are discussed, as well as advantages and disadvantages compared to other methods of collecting electron diffraction data.
引用
收藏
页码：94 / 102
页数：9
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