2018 JOINT IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY AND 2018 IEEE ASIA-PACIFIC SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC/APEMC)
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2018年
The radiated emissions (RE) measurement is one of the tests that are mandatory in a full qualification stage in order to validate an electronic or electric product for series production. The purpose of this paper is to present a near-field scan technique for mitigating RE levels in order to reduce the time to market for the product. The magnetic near-field data are measured by using an EHX+ system from EMSCAN and the results are validated with the far-field measurements data obtained in a semi-anechoic chamber. Acquired data are used for finding a solution to mitigate the emissions in radiated emissions testing in order to pass the limits imposed by the OEM (Original Equipment Manufacturer).