We studied the variation in perpendicular magnetic anisotropy of (111) textured Au/N x [Co/Ni]/Au films as a function of the number of bilayer repeats N. The ferromagnetic resonance and superconducting quantum interference device magnetometer measurements show that the perpendicular magnetic anisotropy of Co/Ni multilayers first increases with N for N <= 10 and then moderately decreases for N > 10. The model we propose reveals that the decrease of the anisotropy for N < 10 is predominantly due to the reduction in the magnetoelastic and magnetocrystalline anisotropies. A moderate decrease in the perpendicular magnetic anisotropy for N > 10 is due to the reduction in the magnetocrystalline and the surface anisotropies. To calculate the contribution of magnetoelastic anisotropy in the Co/Ni multilayers, in-plane and out-of-plane x-ray diffraction measurements are performed to determine the spacing between Co/Ni (111) and (220) planes. The magnetocrystalline bulk anisotropy is estimated from the difference in the perpendicular and parallel g factors of Co/Ni multilayers that are measured using the in-plane and out-of-plane ferromagnetic resonance measurements. Transmission electron microscopy has been used to estimate the multilayer film roughness. These values are used to calculate the roughness-induced surface and magnetocrystalline anisotropy coefficients as a function of N.
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Natl Inst Mat Sci, Magnet Mat Ctr, Tsukuba, Ibaraki 3050047, Japan
Chinese Acad Sci, Beijing Natl Lab Condensed Matter Phys, Inst Phys, Beijing 100080, Peoples R ChinaNatl Inst Mat Sci, Magnet Mat Ctr, Tsukuba, Ibaraki 3050047, Japan
Wang, Wenhong
Sukegawa, Hiroaki
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Natl Inst Mat Sci, Magnet Mat Ctr, Tsukuba, Ibaraki 3050047, JapanNatl Inst Mat Sci, Magnet Mat Ctr, Tsukuba, Ibaraki 3050047, Japan
Sukegawa, Hiroaki
Inomata, Koichiro
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Natl Inst Mat Sci, Magnet Mat Ctr, Tsukuba, Ibaraki 3050047, JapanNatl Inst Mat Sci, Magnet Mat Ctr, Tsukuba, Ibaraki 3050047, Japan
机构:
Korea Univ, Dept Nano Semicond Engn, Seoul 136701, South KoreaIst Nazl Ric Metrol, I-10135 Turin, Italy
Lee, Tae Young
Lim, Sang Ho
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Korea Univ, Dept Nano Semicond Engn, Seoul 136701, South Korea
Korea Univ, Dept Mat Sci & Engn, Seoul 136701, South KoreaIst Nazl Ric Metrol, I-10135 Turin, Italy